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DATE
2008
IEEE

Process Variation Aware Issue Queue Design

13 years 10 months ago
Process Variation Aware Issue Queue Design
In sub-90nm process technology it becomes harder to control the fabrication process, which in turn causes variations between the design-time parameters and the fabricated parameters. Variations in the critical process parameters can result in significant fluctuations in the switching speed and leakage power consumption of different transistors in the same chip. In this paper, we study the impact of process variation on issue queues. Due to process variation, issue queues can take variable access latency. In order to work with nonuniform access latency issue queues, by exploiting ready operands of instructions at dispatch time, we propose a process variation aware issue queue design. Experimental results reveal that, for a 64-entry issue queue with half of the entries affected by process variation, our technique recovers most of the lost performance due to process variation and incurs a performance penalty of less than 2% with respect to the performance of issue queues without proces...
Raghavendra K, Madhu Mutyam
Added 29 May 2010
Updated 29 May 2010
Type Conference
Year 2008
Where DATE
Authors Raghavendra K, Madhu Mutyam
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