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14

DAC
1999
ACM

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Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction

14 years 5 months ago

Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction

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Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz

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Circuits Using Test | DAC 1999 | Design Automation |

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Added	13 Nov 2009
Updated	13 Nov 2009
Type	Conference
Year	1999
Where	DAC
Authors	Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz

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