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DAC
1999
ACM

Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction

11 years 3 months ago
Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction
Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz
Added 13 Nov 2009
Updated 13 Nov 2009
Type Conference
Year 1999
Where DAC
Authors Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz
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