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DATE
2009
IEEE

QC-Fill: An X-Fill method for quick-and-cool scan test

9 years 6 months ago
QC-Fill: An X-Fill method for quick-and-cool scan test
— In this paper, we present an X-Fill (QC-Fill) method for not only slashing the test time but also reducing the test power (including both capture power and shifting power). QC-Fill, built upon the existing multicasting scan architecture, can coexist with most low-capture-power (LCP) X-fill methods through a multicasting-driven X-fill method incorporating a clique-stripping scheme. QC-Fill is independent of the ATPG patterns and does not require any area-overhead since it can directly operate on an existing scan architecture incorporating test compression.
Chao-Wen Tzeng, Shi-Yu Huang
Added 20 May 2010
Updated 20 May 2010
Type Conference
Year 2009
Where DATE
Authors Chao-Wen Tzeng, Shi-Yu Huang
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