QC-Fill: An X-Fill method for quick-and-cool scan test

— In this paper, we present an X-Fill (QC-Fill) method for not only slashing the test time but also reducing the test power (including both capture power and shifting power). QC-Fill, built upon the existing multicasting scan architecture, can coexist with most low-capture-power (LCP) X-fill methods through a multicasting-driven X-fill method incorporating a clique-stripping scheme. QC-Fill is independent of the ATPG patterns and does not require any area-overhead since it can directly operate on an existing scan architecture incorporating test compression.

• Type: Conference
• Year: 2009
• Where: DATE
• Authors: Chao-Wen Tzeng, Shi-Yu Huang
• Keywords: DATE 2009, Hardware, Multicasting Scan Architecture, Scan Architecture, X-fill Method