Random benchmark circuits with controlled attributes

Two major improvements, controlled fan-in and automated initial-circuit production, were made over the random generator of benchmark circuits presented at DAC'94. This is an important progress towards our goal of random benchmarking: more general and secure testing, increasing the naturality of random circuits by controlling their attributes, and obtaining test results by which the dierence of performances under evaluation can be made clear.

• Type: Conference
• Year: 1997
• Where: DATE
• Authors: Kazuo Iwama, Kensuke Hino, Hiroyuki Kurokawa, Sunao Sawada
• Keywords: Automated Initial-circuit Production, DATE 1997, Hardware, Random, Random Generator