Re-Examining the Use of Network-on-Chip as Test Access Mechanism

Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this methodology obviously reduces the routing cost when compared to the case that dedicated test buses are introduced as TAMs, it is not clear whether it is beneficial in terms of other important factors that significantly affect test cost, e.g., testing time, test control complexity and test reliability. As a result, in this paper, we re-examine the issue of using NoC as TAM in order to facilitate designers to construct a cost-effective system test architecture

• Type: Conference
• Year: 2008
• Where: DATE
• Authors: Feng Yuan, Lin Huang, Qiang Xu
• Keywords: DATE 2008, Hardware, Test Access Mechanism, Test Control Complexity, Test Data