Reliability- and process variation-aware placement for FPGAs

Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) due to NBTI is further affected by the initial value of Vth from fabricationinduced process variation (PV). Addressing these challenges in embedded FPGA designs is possible, as FPGA reconfigurablility can be exploited to measure the exact timing degradation of an FPGA due to the joint effect of NBTI and PV at run time with low overhead. The gathered information can then be used to improve the run-time performance and reliability of FPGA designs without targeting the pessimistic worst case. In this paper, we present joint NBTI/PV-aware placement techniques for FPGAs, including NBTI/PV-aware timing analysis, region-based delay estimation, and a new move-acceptance procedure. To evaluate the proposed techniques, we combine PV measurements from 15 Xilinx Virtex-II Pro FPGAs with a model of NBTI. The proposed tech...

• Type: Conference
• Year: 2010
• Where: DATE
• Authors: Assem A. M. Bsoul, Naraig Manjikian, Li Shang
• Keywords: DATE 2010, Embedded Fpga Designs, FPGA, FPGA Designs, Hardware