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2007
IEEE

Robustness of circuits under delay-induced faults : test of AES with the PAFI tool

9 years 10 months ago
Robustness of circuits under delay-induced faults : test of AES with the PAFI tool
Security of cryptographic circuits is a major concern. Fault attacks are a mean to obtain critical information with the use of physical disturbance and cryptanalysis. We propose a methodology and a tool to analyse the robustness of circuit under faults induced by a delay. We tested a circuit implementing AES and showed that delay faults can permit to perform known fault attacks.
Olivier Faurax, Assia Tria, Laurent Freund, Fr&eac
Added 03 Jun 2010
Updated 03 Jun 2010
Type Conference
Year 2007
Where IOLTS
Authors Olivier Faurax, Assia Tria, Laurent Freund, Frédéric Bancel
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