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DATE
2009
IEEE

A scalable method for the generation of small test sets

9 years 6 months ago
A scalable method for the generation of small test sets
This paper presents a scalable method to generate close to minimal size test pattern sets for stuck-at faults in scan based circuits. The method creates sets of potentially compatible faults based on necessary assignments. It guides the justiļ¬cation and propagation decisions to create patterns that will accommodate most targeted faults. The technique presented achieves close to minimal test pattern sets for ISCAS circuits. For industrial circuits it achieves much smaller test pattern sets than other methods in designs sensitive to decision order used in ATPG.
Santiago Remersaro, Janusz Rajski, Sudhakar M. Red
Added 20 May 2010
Updated 20 May 2010
Type Conference
Year 2009
Where DATE
Authors Santiago Remersaro, Janusz Rajski, Sudhakar M. Reddy, Irith Pomeranz
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