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DAC
2001
ACM

Semi-Formal Test Generation with Genevieve

10 years 2 months ago
Semi-Formal Test Generation with Genevieve
This paper describes the first application of the Genevieve test generation methodology. The Genevieve approach uses semi-formal techniques derived from "model-checking" to generate test suites for specific behaviours of the design under test. An "interesting" behaviour is claimed to be unreachable. If a path from an initial state to the state of interest does exist, a counter-example is generated. The sequence of states specifies a test for the desired behaviour. To highlight real problems that could appear during test generation, we chose the Store Data Unit (SDU) of the ST100, a new high performance digital signal processor (DSP) developed by STMicroelectronics. This unit is specifically selected because of the following key issues:
Julia Dushina, Mike Benjamin, Daniel Geist
Added 13 Nov 2009
Updated 13 Nov 2009
Type Conference
Year 2001
Where DAC
Authors Julia Dushina, Mike Benjamin, Daniel Geist
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