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IEICET
2010

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Sequential Locally Optimum Test (SLOT): A Sequential Detection Scheme Based on Locally Optimum Test Statistic

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Sequential Locally Optimum Test (SLOT): A Sequential Detection Scheme Based on Locally Optimum Test Statistic

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Jinsoo Bae, Seong Ill Park, Yun Hee Kim, Seokho Yo

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Added	26 Jan 2011
Updated	26 Jan 2011
Type	Journal
Year	2010
Where	IEICET
Authors	Jinsoo Bae, Seong Ill Park, Yun Hee Kim, Seokho Yoon, Jongho Oh, Iickho Song, Seong-Jun Oh

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