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    SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories

    12 years 11 months ago
    SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories
    Download  www.iis.sinica.edu.tw
    Tsu-Wei Tseng, Jin-Fu Li
    claim paper
    Added 14 May 2011
    Updated 14 May 2011
    Type Journal
    Year 2011
    Where JISE
    Authors Tsu-Wei Tseng, Jin-Fu Li
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