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ISQED
2009
IEEE

Simultaneous test pattern compaction, ordering and X-filling for testing power reduction

10 years 11 months ago
Simultaneous test pattern compaction, ordering and X-filling for testing power reduction
Ju-Yueh Lee, Yu Hu, Rupak Majumdar, Lei He
Added 19 May 2010
Updated 19 May 2010
Type Conference
Year 2009
Where ISQED
Authors Ju-Yueh Lee, Yu Hu, Rupak Majumdar, Lei He
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