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ICRA
2008
IEEE

SLAM for ship hull inspection using exactly sparse extended information filters

13 years 10 months ago
SLAM for ship hull inspection using exactly sparse extended information filters
Matthew Walter, Franz Hover, John J. Leonard
Added 30 May 2010
Updated 30 May 2010
Type Conference
Year 2008
Where ICRA
Authors Matthew Walter, Franz Hover, John J. Leonard
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