Software-based self-test of processors under power constraints

Software-based self-test (SBST) of processors offers many benefits, such as dispense with expensive test equipments, test execution during maintenance and in the field or initialization tests for the whole system. In this paper, for the first time a structural SBST methodology is proposed which optimizes energy, average power consumption, test length and fault coverage at the same time. Key words: Test program generation, processor test, low power test

• Type: Conference
• Year: 2006
• Where: DATE
• Authors: Jun Zhou, Hans-Joachim Wunderlich
• Keywords: DATE 2006, Expensive Test Equipments, Hardware, Low Power Test, Test Program Generation