Specification Coverage Aided Test Selection

In this paper test selection strategies in formal conformance testing are considered. As the testing conformance relation we use the ioco relation, and extend the previously presented on-the-fly test generation algorithms for ioco to include test selection heuristic based on a specification coverage metric. The proposed method combines a greedy test selection with randomization to guarantee completeness. As a novel implementation technique we employ bounded model checking for lookahead in greedy test selection.

• Type: Conference
• Year: 2003
• Where: ACSD
• Authors: Tuomo Pyhälä, Keijo Heljanko
• Keywords: ACSD 2003, Greedy Test Selection, Hardware, Test Selection, Test Selection Strategies