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6

ISQED
2008
IEEE

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A Statistic-Based Approach to Testability Analysis

13 years 11 months ago

A Statistic-Based Approach to Testability Analysis

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This paper presents a statistic-based approach for evaluating the testability of nodes in combinational circuits. This testability measurement is obtained via Monte Carlo simulation governed by the formulated Monte Carlo model. The Monte Carlo simulation is terminated when the predeﬁned error with respect to the Monte Carlo model, under a speciﬁed conﬁdence level, is achieved. We conduct the experiments on a set of ISCAS’85 and MCNC benchmarks. As compared with previous work, our approach more efﬁciently evaluates the testability with less error rate.

Chuang-Chi Chiou, Chun-Yao Wang, Yung-Chih Chen

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Hardware | ISQED 2008 | Monte Carlo | Monte Carlo Model | Monte Carlo Simulation |

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Added	31 May 2010
Updated	31 May 2010
Type	Conference
Year	2008
Where	ISQED
Authors	Chuang-Chi Chiou, Chun-Yao Wang, Yung-Chih Chen

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