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DSN
2008
IEEE

Statistical Fault Injection

13 years 10 months ago
Statistical Fault Injection
A method for Statistical Fault Injection (SFI) into arbitrary latches within a full system hardware-emulated model is validated against particle-beam-accelerated SER testing for a modern microprocessor. As performed on the IBM POWER6 microprocessor, SFI is capable of distinguishing between error handling states associated with the injected bit flip. Methodologies to perform random and targeted fault injection are presented. Keywords – Fault Injection, Soft Errors, SER, SFI
Pradeep Ramachandran, Prabhakar Kudva, Jeffrey W.
Added 29 May 2010
Updated 29 May 2010
Type Conference
Year 2008
Where DSN
Authors Pradeep Ramachandran, Prabhakar Kudva, Jeffrey W. Kellington, John Schumann, Pia Sanda
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