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ASPDAC
2009
ACM

Statistical modeling and analysis of chip-level leakage power by spectral stochastic method

9 years 24 days ago
Statistical modeling and analysis of chip-level leakage power by spectral stochastic method
In this paper, we present a novel statistical full-chip leakage power analysis method. The new method can provide a general framework to derive the full-chip leakage current or power in a closed form in terms of the variational parameters, such as the channel length, the gate oxide thickness, etc. It can accommodate various spatial correlations. The new method employs the orthogonal polynomials to represent the variational gate leakages in a closed form first, which is generated by a fast multi-dimensional Gaussian quadrature method. The total leakage currents then are computed by simply summing up the resulting orthogonal polynomials (their coefficients). Unlike many existing approaches, no grid-based partitioning and approximation are required. Instead, the spatial correlations are naturally handled by orthogonal decompositions. The proposed method is very efficient and it becomes linear in the presence of strong spatial correlations. Experimental results show that the proposed met...
Ruijing Shen, Ning Mi, Sheldon X.-D. Tan, Yici Cai
Added 27 May 2010
Updated 27 May 2010
Type Conference
Year 2009
Where ASPDAC
Authors Ruijing Shen, Ning Mi, Sheldon X.-D. Tan, Yici Cai, Xianlong Hong
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