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11

DATE
2005
IEEE

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Statistical Timing Analysis using Levelized Covariance Propagation

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Statistical Timing Analysis using Levelized Covariance Propagation

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Variability in process parameters is making accurate timing analysis of nano-scale integrated circuits an extremely challenging task. In this paper, we propose a new algorithm for statistical timing analysis using Levelized Covariance Propagation (LCP). The algorithm simultaneously considers the impact of random placement of dopants (which makes every transistor in a die independent in terms of threshold voltage) and the spatial correlation of the process parameters such as channel length, transistor width and oxide thickness due to the intra-die variations. It also considers the signal correlation due to reconvergent paths in the circuit. Results on several benchmark cir

Kunhyuk Kang, Bipul Chandra Paul, Kaushik Roy

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Accurate Timing Analysis | DATE 2005 | Hardware | Process Parameters | Timing Analysis |

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Added	24 Jun 2010
Updated	24 Jun 2010
Type	Conference
Year	2005
Where	DATE
Authors	Kunhyuk Kang, Bipul Chandra Paul, Kaushik Roy

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