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2005
ACM

StressTest: an automatic approach to test generation via activity monitors

9 years 11 months ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced microprocessor vendors to employ immense verification teams in the hope of finding the most critical bugs in a timely manner. Unfortunately, too often size doesn't seem to matter for verification teams, as design schedules continue to slip and microprocessors find their way to the marketplace with design errors. In this paper, we describe a simulationbased random test generation tool, called StressTest, that provides assistance in locating hard-to-find corner-case design bugs and performance problems. StressTest is based on a Markov-model-driven random instruction generator with activity monitors. The model is generated from the userspecified template programs and is used to generate the instructions sent to the design under test (DUT). In addition, the user specifies key activity points within the desig...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
Added 13 Nov 2009
Updated 13 Nov 2009
Type Conference
Year 2005
Where DAC
Authors Ilya Wagner, Valeria Bertacco, Todd M. Austin
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