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2000
ACM

System chip test: how will it impact your design?

10 years 11 months ago
System chip test: how will it impact your design?
A major challenge in realizing core-based system chips is the adoption and design-in of adequate test and diagnosis strategies. This tutorial paper discusses the specific challenges that come with testing deeply embedded reusable cores supplied by diverse providers, who often use different hardware description levels and mixed technologies. The paper describes a general test access architecture for embedded cores, and covers the current standardization efforts in this domain. In addition, we give an overview of the emerging EDA developments in SOC test, and illustrate the current industrial practices by means of two case studies.
Yervant Zorian, Erik Jan Marinissen
Added 13 Nov 2009
Updated 13 Nov 2009
Type Conference
Year 2000
Where DAC
Authors Yervant Zorian, Erik Jan Marinissen
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