The Test Ability of an Adaptive Pulse Wave for ADC Testing

In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an increasing number of ADCs are integrated into a system-on-chip (SoC) platform design, which usually contains a digital embedded processor. In such a platform, a digital pulse wave is obviously less expensive to generate than an accurate analogue sine wave. As a result, the usage of a digital pulse wave has been investigated to test ADCs as the test stimulus. In this paper, the ability of a digital adaptive pulse wave for ADC testing is presented via the measurement results. Instead of the conventional FFT analysis, a timedomain analysis is exploited for post-processing, from which a signature result can be obtained. This signature can distinguish between faulty devices and the fault-free devices. It is also used in the machine-learning-based test method to predict the dynamic specifications of the ADC. The e...

• Type: Journal
• Year: 2010
• Where: ATS
• Authors: Xiaoqin Sheng, Hans G. Kerkhoff
• Keywords: Analogue Sine Wave, ATS 2010, Digital Pulse Wave, Hardware, Pulse Wave