Test generation for combinational quantum cellular automata (QCA) circuits

— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent attention and shows immense promise as a viable future technology. This work is motivated by the fact that the stuck-at fault test set of a circuit is not guaranteed to detect all defects that can occur in its QCA implementation. We show how to generate additional test vectors to supplement the stuck-at fault test set to guarantee that all simulated defects in the QCA gates get detected. Since nanotechnologies will be dominated by interconnects, we also target bridging faults on QCA interconnects. The efficacy of our framework is established through its application to QCA implementations of MCNC benchmarks that use majority gates as primitives.

• Type: Conference
• Year: 2006
• Where: DATE
• Authors: Pallav Gupta, Niraj K. Jha, Loganathan Lingappan
• Keywords: DATE 2006, Fault Test Set, Hardware, Qca Implementations, Stuck-at Fault Test