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19

ITC
1996
IEEE

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Test Generation for Global Delay Faults

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Test Generation for Global Delay Faults

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This paper describes test generation for delay faults caused by global process disturbances. The structural and spatial correlation between path delays is used to reduce the number of paths that must be tested. Results are given for the ISCAS85 benchmarks.

G. M. Luong, D. M. H. Walker

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More Details (n/a)

Added	07 Aug 2010
Updated	07 Aug 2010
Type	Conference
Year	1996
Where	ITC
Authors	G. M. Luong, D. M. H. Walker

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