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DAC
2004
ACM

On test generation for transition faults with minimized peak power dissipation

9 years 2 months ago
On test generation for transition faults with minimized peak power dissipation
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests for stuck-at faults. The proposed method is suitable for use in testing scan designs that employ enhanced scan. The method reduces the peak power consumption in benchmark circuits by 19% on the average with essentially the same test set size and the same fault coverage compared to an earlier method. Categories and subject descriptors B.8.1 [Performance and Reliability]: Reliability, Testing and Fault-Tolerance General terms Algorithm, Design, Reliability Keywords Power Dissipation, Test Generation, Transition Faults
Wei Li, Sudhakar M. Reddy, Irith Pomeranz
Added 20 Aug 2010
Updated 20 Aug 2010
Type Conference
Year 2004
Where DAC
Authors Wei Li, Sudhakar M. Reddy, Irith Pomeranz
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