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ISMVL
1996
IEEE

Testability of Generalized Multiple-Valued Reed-Muller Circuits

13 years 9 months ago
Testability of Generalized Multiple-Valued Reed-Muller Circuits
Elena Dubrova, Jon C. Muzio
Added 07 Aug 2010
Updated 07 Aug 2010
Type Conference
Year 1996
Where ISMVL
Authors Elena Dubrova, Jon C. Muzio
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