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ISCAS
2005
IEEE

A two-step DDEM ADC for accurate and cost-effective DAC testing

13 years 9 months ago
A two-step DDEM ADC for accurate and cost-effective DAC testing
— This paper presents a scheme for testing DACs’ static non-linearity errors by using a two-step flash ADC with deterministic dynamic element matching (DDEM). In this work, the structure of the two-step ADC, the switching strategy of DDEM, and the DAC test algorithm are discussed. The performance of the proposed approach is validated by using numerical simulation. Simulation results show that a low accuracy two-step ADC with an 8-bit coarse stage and a 6-bit fine stage is capable of testing a 14-bit DAC to 1-LSB accuracy by using the proposed DDEM strategy. This test approach has potential for build-in self-test (BIST) of precision DACs because of the low requirement on ADC performance and the simple element matching strategy.
Hanqing Xing, Degang Chen, Randall L. Geiger
Added 25 Jun 2010
Updated 25 Jun 2010
Type Conference
Year 2005
Where ISCAS
Authors Hanqing Xing, Degang Chen, Randall L. Geiger
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