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DATE
2003
IEEE

A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization

13 years 9 months ago
A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization
Vikram Iyengar, Anshuman Chandra, Sharon Schweizer
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where DATE
Authors Vikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty
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