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2007
IEEE

Using Scan-Dump Values to Improve Functional-Diagnosis Methodology

10 years 10 months ago
Using Scan-Dump Values to Improve Functional-Diagnosis Methodology
In this paper, we identify two main bottlenecks in the functional diagnosis flow and propose new ways to overcome these. Our approach completely eliminates the “Primary Input (PI) pattern generation and simulation” step and instead employs scan-dump values extracted from the tester. We utilize backward and forward logic implications of the scan-dump values to reconstruct more logic values for the circuit signals. Furthermore, we employ the reset state for the non-scan latches of the design to increase the number of specified signals in the overall circuit. Experimental results on stuck-at faults on industrial designs show that, in most cases, these reconstructed values are sufficient to correctly diagnose a fault, thereby avoiding hours of conventional functional diagnosis runtimes.
Vishnu C. Vimjam, Enamul Amyeen, Ruifeng Guo, Srik
Added 04 Jun 2010
Updated 04 Jun 2010
Type Conference
Year 2007
Where VTS
Authors Vishnu C. Vimjam, Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang
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