Validation and test generation for oscillatory noise in VLSI interconnects

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: Inductance of on-chip interconnects gives rise to signal overshoots and undershoots that can cause logic errors. By considering technology trends, we show that in 0.13

Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer

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Hardware | ICCAD 1999 | Inductance Induced Oscillation | Interconnects Gives Rise | Logic Errors |

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Added	03 Aug 2010
Updated	03 Aug 2010
Type	Conference
Year	1999
Where	ICCAD
Authors	Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer

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Validation and test generation for oscillatory noise in VLSI interconnects

Hardware | ICCAD 1999 | Inductance Induced Oscillation | Interconnects Gives Rise | Logic Errors |

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