Variation-driven device sizing for minimum energy sub-threshold circuits

Sub-threshold operation is a compelling approach for energyconstrained applications, but increased sensitivity to variation must be mitigated. We explore variability metrics and the variation sensitivity of stacked device topologies. We show that upsizing is necessary to achieve robustness at reduced voltages and propose a design methodology to meet yield constraints. The need for upsizing imposes an energy overhead, influencing the optimal supply voltage to minimize energy. Finally, we characterize performance variability by summing delay distributions of each stage in an arbitrary critical path and achieve results accurate to within 10% of Monte Carlo simulation. Categories and Subject Descriptors: B.8.1 [Reliability, Testing, and Fault-Tolerance] General Terms: Performance, Design, Reliability

• Type: Conference
• Year: 2006
• Where: ISLPED
• Authors: Joyce Kwong, Anantha P. Chandrakasan
• Keywords: ISLPED 2006, Stacked Device Topologies, Variability Metrics, Variation Sensitivity