31 search results - page 1 / 7 » A Comprehensive SoC Design Methodology for Nanometer Design ... |
VLSID
2006
IEEE
14 years 4 months ago
2006
IEEE
SoC design methodologies are under constant revision due to adoption of fast shrinking process technologies at nanometer levels. Nanometer process geometries exhibit new complex d...
DAC
2002
ACM
14 years 5 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
COMPUTER
2002
13 years 4 months ago
2002
of abstraction and coarse granularity and distributed communication control. Focusing on using probabilistic metrics such as average values or variance to quantify design objective...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
Modern integrated circuits (ICs) are becoming increasingly complex. The complexity makes it difficult to design, manufacture and integrate these high-performance ICs. The advent o...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
The use of CMOS nanometer technologies at 65 nm and below will pose serious challenges on the design of mixed-signal integrated systems in the very near future. Rising design comp...