14 search results - page 1 / 3 » A Fault Primitive Based Analysis of Linked Faults in RAMs |
MTDT
2003
IEEE
13 years 10 months ago
2003
IEEE
: Linked faults are very important for memory testing because they reduce the fault coverage of the tests. Their analysis has proven to be a source for new memory tests, characteri...
ICCAD
1997
IEEE
13 years 9 months ago
1997
IEEE
EAAI
2010
13 years 5 months ago
2010
: Qualitative trend analysis (QTA) is a process-history-based data-driven technique that works by extracting important features (trends) from the measured signals and evaluating th...
ICCAD
2000
IEEE
13 years 10 months ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
Built-in self-repair (BISR) technique is gaining popular for repairing embedded memory cores in system-onchips (SOCs). To increase the utilization of memory redundancy, the BISR t...