50 search results - page 10 / 10 » A Hamming Distance Based Test Pattern Generator with Improve... |
ATS
2000
IEEE
13 years 10 months ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...
CONSTRAINTS
2007
13 years 6 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
INFOCOM
2011
IEEE
12 years 9 months ago
2011
IEEE
—In wireless sensor networks, multiple-coverage, in which each point is covered by more than one sensor, is often required to improve detection quality and achieve high fault tol...
TEC
2008
13 years 5 months ago
2008
In this paper, we propose an evolutionary approach to the design of output codes for multiclass pattern recognition problems. This approach has the advantage of taking into account...
DAC
2003
ACM
14 years 7 months ago
2003
ACM
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...