12 search results - page 2 / 3 » A Mechanism for Online Diagnosis of Hard Faults in Microproc... |
ASPLOS
2006
ACM
13 years 11 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
TC
2010
13 years 4 months ago
2010
—The number of CPUs in chip multiprocessors is growing at the Moore’s Law rate, due to continued technology advances. However, new technologies pose serious reliability challen...
EMSOFT
2006
Springer
13 years 9 months ago
2006
Springer
Portable systems such as cell phones and portable media players commonly use non-volatile RAM (NVRAM) to hold all of their data and metadata, and larger systems can store metadata...
DATE
2007
IEEE
13 years 12 months ago
2007
IEEE
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
NSDI
2008
13 years 8 months ago
2008
Very few computer systems that have been deployed in rural developing regions manage to stay operationally sustainable over the long term; most systems do not go beyond the pilot ...