37 search results - page 1 / 8 » A New Embedded Measurement Structure for eDRAM Capacitor |
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
ICC
2007
IEEE
13 years 8 months ago
2007
IEEE
With the advance of semiconductor manufacturing, There are many approaches to deal with these problems. EDA, and VLSI design technologies, circuits with even higher Adding discrete...
ICPR
2008
IEEE
13 years 11 months ago
2008
IEEE
In video surveillance, the size of face images is very small. However, few works have been done to investigate scale invariant face recognition. Our experiments on appearance-base...
NIPS
2008
13 years 6 months ago
2008
Many machine learning algorithms can be formulated in the framework of statistical independence such as the Hilbert Schmidt Independence Criterion. In this paper, we extend this c...
AAAI
2010
13 years 1 months ago
2010
Dimensionality reduction plays an important role in many machine learning and pattern recognition tasks. In this paper, we present a novel dimensionality reduction algorithm calle...