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ICCD
2006
IEEE
127views Hardware» more  ICCD 2006»
14 years 2 months ago
Power Droop Testing
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd...
ICT
2004
Springer
194views Communications» more  ICT 2004»
13 years 11 months ago
Competitive Neural Networks for Fault Detection and Diagnosis in 3G Cellular Systems
We propose a new approach to fault detection and diagnosis in third-generation (3G) cellular networks using competitive neural algorithms. For density estimation purposes, a given ...
Guilherme De A. Barreto, João Cesar M. Mota...