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ISQED
2005
IEEE
125views Hardware» more  ISQED 2005»
13 years 10 months ago
A New Method for Design of Robust Digital Circuits
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...
Dinesh Patil, Sunghee Yun, Seung-Jean Kim, Alvin C...
ISCAS
2007
IEEE
112views Hardware» more  ISCAS 2007»
13 years 10 months ago
A New Statistical Approach for Glitch Estimation in Combinational Circuits
— Low-power consumption has become a highly important concern for synchronous standard-cell design, and consequently mandates the use of low-power design methodologies and techni...
Ahmed Sayed, Hussain Al-Asaad
DSD
2010
IEEE
140views Hardware» more  DSD 2010»
13 years 4 months ago
RobuCheck: A Robustness Checker for Digital Circuits
Abstract—Continuously shrinking feature sizes cause an increasing vulnerability of digital circuits. Manufacturing failures and transient faults may tamper the functionality. Aut...
Stefan Frehse, Görschwin Fey, André S&...
DATE
1999
IEEE
73views Hardware» more  DATE 1999»
13 years 8 months ago
Design For Testability Method for CML Digital Circuits
This paper presents a new Design for Testability (DFT) technique for Current-Mode Logic (CML) circuits. This new technique, with little overhead, using built-in detectors, monitor...
Bernard Antaki, Yvon Savaria, Nanhan Xiong, Saman ...
TVLSI
2002
366views more  TVLSI 2002»
13 years 4 months ago
Gate-diffusion input (GDI): a power-efficient method for digital combinatorial circuits
Gate diffusion input (GDI)--a new technique of low-power digital combinatorial circuit design--is described. This technique allows reducing power consumption, propagation delay, an...
Arkadiy Morgenshtein, Alexander Fish, Israel A. Wa...