3 search results - page 1 / 1 » A Parallel Built-In Self-Diagnostic Method For Embedded Memo... |
VLSID
2001
IEEE
14 years 4 months ago
2001
IEEE
VLSID
2001
IEEE
14 years 4 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Conventional cache models are not suited for real-time parallel processing because tasks may flush each other’s data out of the cache in an unpredictable manner. In this way th...