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CVPR
2006
IEEE
14 years 6 months ago
An Intensity-augmented Ordinal Measure for Visual Correspondence
Determining the correspondence of image patches is one of the most important problems in Computer Vision. When the intensity space is variant due to several factors such as the ca...
Anurag Mittal, Visvanathan Ramesh
CVPR
2008
IEEE
14 years 6 months ago
Probabilistic image registration and anomaly detection by nonlinear warping
Automatic, defect tolerant registration of transmission electron microscopy (TEM) images poses an important and challenging problem for biomedical image analysis, e.g. in computat...
Verena Kaynig, Bernd Fischer, Joachim M. Buhmann
PAMI
1998
170views more  PAMI 1998»
13 years 4 months ago
Ordinal Measures for Image Correspondence
—We present ordinal measures of association for image correspondence in the context of stereo. Linear correspondence measures like correlation and the sum of squared difference b...
Dinkar N. Bhat, Shree K. Nayar
CVPR
2010
IEEE
13 years 10 months ago
Line Matching Leveraged By Point Correspondences
A novel method for line matching is proposed. The basic idea is to use tentative point correspondences, which can be easily obtained by keypoint matching methods, to significantly...
Bin Fan, Fuchao Wu, Zhanyi Hu
SIGGRAPH
1989
ACM
13 years 8 months ago
A general two-pass method integrating specular and diffuse reflection
We analyse some recent approaches to the global illumination problem by introducing the corresponding reflection operators, and we demonstrate the advantages of a two-pass method....
François X. Sillion, Claude Puech