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CORR
2011
Springer
151views Education» more  CORR 2011»
11 years 8 months ago
A Simulation Experiment on a Built-In Self Test Equipped with Pseudorandom Test Pattern Generator and Multi-Input Shift Register
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
A. Ahmad
MTDT
2000
IEEE
129views Hardware» more  MTDT 2000»
12 years 6 months ago
Using GLFSRs for Pseudo-Random Memory BIST
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
Michael Redeker, Markus Rudack, Thomas Lobbe, Dirk...
DATE
1997
IEEE
100views Hardware» more  DATE 1997»
12 years 5 months ago
On the generation of pseudo-deterministic two-patterns test sequence with LFSRs
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
Christian Dufaza, Yervant Zorian
ATS
1998
IEEE
170views Hardware» more  ATS 1998»
12 years 6 months ago
A Ring Architecture Strategy for BIST Test Pattern Generation
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
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