This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
Michael Redeker, Markus Rudack, Thomas Lobbe, Dirk...
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...