219 search results - page 1 / 44 » A Simulation-Based Test Generation Scheme Using Genetic Algo... |
VLSID
1993
IEEE
13 years 9 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
VLSID
1997
IEEE
13 years 9 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
ACMSE
2006
ACM
13 years 10 months ago
2006
ACM
Like in other fields, computer products (applications, hardware, etc.), before being marketed, require some level of testing to verify whether they meet their design and function...
IWANN
2009
Springer
13 years 11 months ago
2009
Springer
Generating test data for formal state based specifications is computationally expensive. This paper improves a framework that addresses this issue by representing the test data ge...
INFORMATICASI
2010
13 years 2 months ago
2010
