57 search results - page 1 / 12 » A Statistical Approach to the Timing-Yield Optimization of P... |
PATMOS
2007
Springer
13 years 10 months ago
2007
Springer
Abstract. The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern ci...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
DAC
2004
ACM
13 years 8 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
ISCAS
2005
IEEE
13 years 10 months ago
2005
IEEE
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
ISQED
2006
IEEE
13 years 10 months ago
2006
IEEE
Process variation has become a major concern in the design of many nanometer circuits, including interconnect pipelines. This paper develops closed-form models to predict the dela...