641 search results - page 1 / 129 » A Study in Coverage-Driven Test Generation |
DAC
1999
ACM
14 years 6 months ago
1999
ACM
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
KBSE
1999
IEEE
13 years 9 months ago
1999
IEEE
CORR
2011
Springer
13 years 9 days ago
2011
Springer
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
PTS
2010
13 years 3 months ago
2010
This paper addresses the challenge of generating test sets that achieve functional coverage, in the absence of a complete specification. The inductive testing technique works by p...