36 search results - page 2 / 8 » A Systematic Approach for Diagnosing Multiple Delay Faults |
DSS
2008
13 years 5 months ago
2008
Human decision making is error-prone and often subject to biases. Important information cues are misweighted and feedback delays hamper learning. Experimentally, task information ...
ET
2010
13 years 3 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...
ASPDAC
2004
ACM
13 years 10 months ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
DSN
2007
IEEE
13 years 11 months ago
2007
IEEE
Transient faults are emerging as a critical concern in the reliability of general-purpose microprocessors. As architectural trends point towards multi-threaded multi-core designs,...
DAC
2006
ACM
13 years 7 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...