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ICCAD
2000
IEEE
171views Hardware» more  ICCAD 2000»
13 years 9 months ago
A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
Michael Pronath, Volker Gloeckel, Helmut E. Graeb