33 search results - page 2 / 7 » A Two Phase Approach for Minimal Diagnostic Test Set Generat... |
ISQED
2002
IEEE
13 years 9 months ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
CORR
2010
Springer
13 years 2 months ago
2010
Springer
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
CONCUR
1991
Springer
13 years 8 months ago
1991
Springer
This paper deals with verification methods based on equivalence relations between labeled transition systems. More precisely, we are concerned by two practical needs: how to effi...
EDBT
2010
ACM
13 years 9 months ago
2010
ACM
Database engines and database-centric applications have become complex software systems. Ensuring bug-free database services is therefore a very difficult task. Whenever possible...