2 search results - page 1 / 1 » A hierarchical floating random walk algorithm for fabric-awa... |
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
With the adoption of ultra regular fabric paradigms for controlling design printability at the 22nm node and beyond, there is an emerging need for a layout-driven, pattern-based p...
VLSID
2005
IEEE
14 years 4 months ago
2005
IEEE
In this article we address efficiency issues in implementation of Monte Carlo algorithm for 3D capacitance extraction. Error bounds in statistical capacitance estimation are discus...