2 search results - page 1 / 1 » A new design-for-test technique for SRAM core-cell stability... |
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
The detection of cell stability and data retention faults in SRAMs has been a time consuming process. In this paper we discuss a new design for test technique called Weak Write Tes...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—Core-cell stability represents the ability of the core-cell to keep the stored data. With the rapid development of semiconductor memories, their test is becoming a major concern...