4 search results - page 1 / 1 » A new method of generating synchronizable test sequences tha... |
SAC
2006
ACM
13 years 4 months ago
2006
ACM
The objective of testing is to determine the conformance between a system and its specification. When testing distributed systems, the existence of multiple testers brings out the...
PTS
1993
13 years 5 months ago
1993
In the area of testing communication systems, the interfaces between systems to be tested and their testers have great impact on test generation and fault detectability. Several t...
DATE
1999
IEEE
13 years 8 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
TCAD
2008
13 years 4 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...